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Trace Element Detection - A Technology People Were Talking About At SPIE DSS

SPIE DSS 2012 featured many interesting technologies, including trace element detection and various approaches to thermal imaging. Trace element detection technology had a significant presence at this year's SPIE DSS Show, held in Baltimore, USA. “The event brings together a lot of developers of photonic sensors that measure the spectroscopic signatures of materials such as chemicals, biological materials, trace gases, and toxins,” said  Peter Hallett, SPIE director of marketing and industry relations.

Trace element detection technology had a significant presence. “The event brings together a lot of developers of photonic sensors that measure the spectroscopic signatures of materials such as chemicals, biological materials, trace gases, and toxins,” Hallett said. Applications also include oceanography, pollution control, precision agriculture, and pathogen detection.

Telops introduced its new real-time gas detection and identification software, Reveal D&I at SPIE DSS 12. Reveal D&I allows the user to detect a large portfolio of gases simultaneously and can be used for the monitoring of chemical warfare agents, toxic industrial chemicals, leak detection, and pollution. Reveal D&I is designed for use with the Telops Hyper-Cam, a standoff infrared hyperspectral imaging sensor.

“Standoff detection and identification of trace solid chemicals has become a rapidly growing application for our Hyper-Cam hyperspectral imager,” said Vincent Farley, business development manager at Telops. “Telops has demonstrated successful results for this challenging application in both ground-based and airborne configurations.”

More information can be found in Telops application notes.

Source : www.photonicsonline.com

Full article can be found here.